Publication:

Distribution function based simulations of hot-carrier degradation in nanowire FETs

Date

2018

Proceedings Paper

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Author(s)

Vandemaele, Michiel

;

;

Stanojevic, Zlatan

;

Tyaginov, Stanislav

;

Makarov, Alexander

;

Vaisman Chasin, Adrian

;

;

Linten, Dimitri

;

Groeseneken, Guido

Metrics

1984 since deposited on 2021-10-26

Acq. date: 2025-12-10