Publication:

Distribution function based simulations of hot-carrier degradation in nanowire FETs

Date

2018
Proceedings Paper
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dc.contributor.authorVandemaele, Michiel
dc.contributor.authorKaczer, Ben
dc.contributor.authorStanojevic, Zlatan
dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorMakarov, Alexander
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorMertens, Hans
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorMertens, Hans
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-26T07:38:52Z
dc.date.available2021-10-26T07:38:52Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32122
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8727081
dc.source.beginpage1
dc.source.conferenceInternational Integrated Reliability Workshop (IIRW)
dc.source.conferencedate7/10/2018
dc.source.conferencelocationSouth Lake Tahoe, CA USA
dc.source.endpage4
dc.title

Distribution function based simulations of hot-carrier degradation in nanowire FETs

dc.typeProceedings paper
dspace.entity.typePublication
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