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Articles
Hot carrier degradation phenomena in lateral and vertical DMOS transistors
Publication:
Hot carrier degradation phenomena in lateral and vertical DMOS transistors
Date
2004-04
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Moens, Peter
;
Van den Bosch, Geert
;
Groeseneken, Guido
Journal
IEEE Trans. Electron Devices
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1911
since deposited on 2021-10-15
Acq. date: 2025-10-27
Citations
Metrics
Views
1911
since deposited on 2021-10-15
Acq. date: 2025-10-27
Citations