Publication:
Hot carrier degradation phenomena in lateral and vertical DMOS transistors
Date
| dc.contributor.author | Moens, Peter | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Moens, Peter | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.date.accessioned | 2021-10-15T14:56:18Z | |
| dc.date.available | 2021-10-15T14:56:18Z | |
| dc.date.issued | 2004-04 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9312 | |
| dc.source.beginpage | 623 | |
| dc.source.endpage | 628 | |
| dc.source.issue | 4 | |
| dc.source.journal | IEEE Trans. Electron Devices | |
| dc.source.volume | 51 | |
| dc.title | Hot carrier degradation phenomena in lateral and vertical DMOS transistors | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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