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Depth profiling of strain using micro-Raman measurements
Publication:
Depth profiling of strain using micro-Raman measurements
Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Atkinson, A.
;
Jain, Suresh
;
Maes, Herman
;
Pinardi, Kuntjoro
;
Willander, M.
Journal
Semiconductor Science and Technology
Abstract
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1929
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1929
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations