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Investigation of high-k-metal gate integration for sub 45 nm planar bulk CMOS technologies
Publication:
Investigation of high-k-metal gate integration for sub 45 nm planar bulk CMOS technologies
Date
2008-12
Dissertation
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20152.pdf
23.38 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Singanamalla, Raghunath
Journal
Abstract
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1939
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1939
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations