Publication:
Direct estimation of captive cross sections in the presence of low capture: application of the identifcation of quenched-in deep-level defects in Ge
Date
| dc.contributor.author | Segers, Siegfried | |
| dc.contributor.author | Lauwaert, Johan | |
| dc.contributor.author | Clauws, Paul | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Vanhellemont, Jan | |
| dc.contributor.author | Callens, Freddy | |
| dc.contributor.author | Vrielinck, Henk | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-22T05:38:46Z | |
| dc.date.available | 2021-10-22T05:38:46Z | |
| dc.date.issued | 2014 | |
| dc.identifier.issn | 0268-1242 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24502 | |
| dc.source.beginpage | 125007 | |
| dc.source.issue | 12 | |
| dc.source.journal | Semiconductor Science and Technology | |
| dc.source.volume | 29 | |
| dc.title | Direct estimation of captive cross sections in the presence of low capture: application of the identifcation of quenched-in deep-level defects in Ge | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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