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Impact of thinning and through silicon via proximity on high-k / metal gate first CMOS performance
Publication:
Impact of thinning and through silicon via proximity on high-k / metal gate first CMOS performance
Date
2010
Proceedings Paper
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20209.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mercha, Abdelkarim
;
Redolfi, Augusto
;
Stucchi, Michele
;
Minas, Nikolaos
;
Van Olmen, Jan
;
Thangaraju, Sarasvathi
;
Velenis, Dimitrios
;
Domae, Shinichi
;
Yang, Yu
;
Katti, Guruprasad
;
Labie, Riet
;
Okoro, Chukwudi
;
Zhao, Ming
;
Asimakopoulos, Panagiotis
;
De Wolf, Ingrid
;
Chiarella, Thomas
;
Schram, Tom
;
Rohr, Erika
;
Van Ammel, Annemie
;
Jourdain, Anne
;
Ruythooren, Wouter
;
Armini, Silvia
;
Radisic, Alex
;
Philipsen, Harold
;
Heylen, Nancy
;
Kostermans, Maarten
;
Jaenen, Patrick
;
Sleeckx, Erik
;
Sabuncuoglu Tezcan, Deniz
;
Debusschere, Ingrid
;
Soussan, Philippe
;
Perry, Dan
;
Van der Plas, Geert
;
Cho, Jong Hoon
;
Marchal, Pol
;
Travaly, Youssef
;
Beyne, Eric
;
Biesemans, Serge
;
Swinnen, Bart
Journal
Abstract
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Views
1971
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1971
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations