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Unbiased roughness measurements for 0.55NA EUV material setup
Publication:
Unbiased roughness measurements for 0.55NA EUV material setup
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Date
2023
Proceedings Paper
https://doi.org/10.1117/12.2658505
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mathew, Bobin
;
Arad, Shahar
;
Brand, Omri
;
Frank, Tal
;
Alkoken, Ran
;
Shilo, Yael
;
Melamed, Yarden
;
Yosef, Rotem Mor
;
Suh, Hyo Seon
;
Heo, Seonggil
;
Halder, Sandip
Journal
Proceedings of SPIE
Abstract
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1091
since deposited on 2023-07-28
Acq. date: 2025-12-17
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Metrics
Downloads
323
since deposited on 2023-07-28
49
last month
8
last week
Acq. date: 2025-12-17
Views
1091
since deposited on 2023-07-28
Acq. date: 2025-12-17
Citations