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Litho and patterning challenges for memory and logic applications at the 22nm node
Publication:
Litho and patterning challenges for memory and logic applications at the 22nm node
Date
2010
Proceedings Paper
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20442.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Finders, Jo
;
Dusa, Mircea
;
Nikolsky, Peter
;
Van Dommelen, Youri
;
Watso, Robert
;
Vandeweyer, Tom
;
Bekaert, Joost
;
Laenens, Bart
;
Van Look, Lieve
Journal
Abstract
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1947
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations
Metrics
Views
1947
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations