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Litho and patterning challenges for memory and logic applications at the 22nm node
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Litho and patterning challenges for memory and logic applications at the 22nm node
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Date
2010
Proceedings Paper
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20442.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Finders, Jo
;
Dusa, Mircea
;
Nikolsky, Peter
;
Van Dommelen, Youri
;
Watso, Robert
;
Vandeweyer, Tom
;
Bekaert, Joost
;
Laenens, Bart
;
Van Look, Lieve
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1950
since deposited on 2021-10-18
3
last month
Acq. date: 2025-12-09
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Metrics
Views
1950
since deposited on 2021-10-18
3
last month
Acq. date: 2025-12-09
Citations