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Orientation dependence of Si1-xCx:P growth and the impact on FinFET structues
Publication:
Orientation dependence of Si1-xCx:P growth and the impact on FinFET structues
Date
2012
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tolle, John
;
Weeks, Doran
;
Bauer, Matthias
;
Machkaoutsan, Vladimir
;
Maes, Jan
;
Togo, Mitsuhiro
;
Brus, Stephan
;
Hikavyy, Andriy
;
Loo, Roger
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1916
since deposited on 2021-10-20
421
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Acq. date: 2025-10-25
Citations
Metrics
Views
1916
since deposited on 2021-10-20
421
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations