Publication:

Orientation dependence of Si1-xCx:P growth and the impact on FinFET structues

Date

 
dc.contributor.authorTolle, John
dc.contributor.authorWeeks, Doran
dc.contributor.authorBauer, Matthias
dc.contributor.authorMachkaoutsan, Vladimir
dc.contributor.authorMaes, Jan
dc.contributor.authorTogo, Mitsuhiro
dc.contributor.authorBrus, Stephan
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorLoo, Roger
dc.contributor.imecauthorMachkaoutsan, Vladimir
dc.contributor.imecauthorMaes, Jan
dc.contributor.imecauthorBrus, Stephan
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-20T17:02:51Z
dc.date.available2021-10-20T17:02:51Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21623
dc.source.beginpage3160
dc.source.conference222nd ECS Meeting, Pacific RIM Meeting on Electrochemical and Solid-State Science
dc.source.conferencedate7/10/2012
dc.source.conferencelocationHonolulu, HI USA
dc.title

Orientation dependence of Si1-xCx:P growth and the impact on FinFET structues

dc.typeMeeting abstract
dspace.entity.typePublication
Files
Publication available in collections: