Publication:

Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI

Date

2023
Journal article
https://doi.org/10.1109/tdmr.2023.3282298
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Author(s)

Rinaudo, Pietro  
;
Vaisman Chasin, Adrian  
;
Franco, Jacopo  
;
Wu, Zhicheng  
;
Subhechha, Subhali  
;
Arutchelvan, Goutham  
;
Eneman, Geert  
;
Yengula Venkata Ramana, Bhuvaneshwari  
;
Rassoul, Nouredine  
;
Delhougne, Romain  
;
Kaczer, Ben  
;
De Wolf, Ingrid  
;
Kar, Gouri Sankar  

Journal

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

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1033 since deposited on 2023-10-11
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Acq. date: 2026-10-13

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