Publication:
Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI
| dc.contributor.author | Rinaudo, Pietro | |
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Wu, Zhicheng | |
| dc.contributor.author | Subhechha, Subhali | |
| dc.contributor.author | Arutchelvan, Goutham | |
| dc.contributor.author | Eneman, Geert | |
| dc.contributor.author | Yengula Venkata Ramana, Bhuvaneshwari | |
| dc.contributor.author | Rassoul, Nouredine | |
| dc.contributor.author | Delhougne, Romain | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | De Wolf, Ingrid | |
| dc.contributor.author | Kar, Gouri Sankar | |
| dc.contributor.imecauthor | Rinaudo, Pietro | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Wu, Zhicheng | |
| dc.contributor.imecauthor | Subhechha, Subhali | |
| dc.contributor.imecauthor | Arutchelvan, Goutham | |
| dc.contributor.imecauthor | Eneman, Geert | |
| dc.contributor.imecauthor | Yengula Venkata Ramana, Bhuvaneshwari | |
| dc.contributor.imecauthor | Rassoul, Nouredine | |
| dc.contributor.imecauthor | Delhougne, Romain | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.imecauthor | Kar, Gouri Sankar | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Subhechha, Subhali::0000-0002-1960-5136 | |
| dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
| dc.contributor.orcidimec | Rassoul, Nouredine::0000-0001-9489-3396 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.date.accessioned | 2023-11-21T09:02:11Z | |
| dc.date.available | 2023-10-11T18:51:57Z | |
| dc.date.available | 2023-11-21T09:02:11Z | |
| dc.date.issued | 2023 | |
| dc.identifier.doi | 10.1109/TDMR.2023.3282298 | |
| dc.identifier.issn | 1530-4388 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42701 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 337 | |
| dc.source.endpage | 345 | |
| dc.source.issue | 3 | |
| dc.source.journal | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | |
| dc.source.numberofpages | 9 | |
| dc.source.volume | 23 | |
| dc.subject.keywords | RELAXATION | |
| dc.title | Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |