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Identification of deep levels associated with extended and point defects in GeSn epitaxial layers using DLTS
Publication:
Identification of deep levels associated with extended and point defects in GeSn epitaxial layers using DLTS
Date
2013
Proceedings Paper
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26652.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gupta, Somya
;
Simoen, Eddy
;
Vrielinck, Henk
;
Merckling, Clement
;
Vincent, Benjamin
;
Gencarelli, Federica
;
Loo, Roger
;
Heyns, Marc
Journal
Abstract
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1960
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
1960
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations