Publication:
Identification of deep levels associated with extended and point defects in GeSn epitaxial layers using DLTS
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1965 since deposited on 2021-10-21
1last month
Acq. date: 2026-01-26
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Statistics
Views
1965 since deposited on 2021-10-21
1last month
Acq. date: 2026-01-26
Citations