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Correlation of actinic blank inspection and experimental phase defect printability study on NXE3x00 EUV scanner
Publication:
Correlation of actinic blank inspection and experimental phase defect printability study on NXE3x00 EUV scanner
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Date
2015
Proceedings Paper
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30430.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jonckheere, Rik
;
Van Den Heuvel, Dieter
;
Takagi, Noriaki
;
Watanabe, Hidehiro
;
Gallagher, Emily
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1966
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Acq. date: 2025-12-12
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Views
1966
since deposited on 2021-10-22
2
last month
Acq. date: 2025-12-12
Citations