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Line edge and width roughness smoothing by plasma treatment
Publication:
Line edge and width roughness smoothing by plasma treatment
Date
2014
Journal article
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30441.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Schepper, Peter
;
Hansen, Terje
;
Altamirano Sanchez, Efrain
;
Vaglio Pret, Alessandro
;
El Otell, Ziad
;
Boullart, Werner
;
De Gendt, Stefan
Journal
Journal of Micro/Nanolithography MEMS and MOEMS
Abstract
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1936
since deposited on 2021-10-22
Acq. date: 2025-10-29
Citations
Metrics
Views
1936
since deposited on 2021-10-22
Acq. date: 2025-10-29
Citations