Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
EUV modeling accruracy and integration requirements for the 16nm node
Publication:
EUV modeling accruracy and integration requirements for the 16nm node
Copy permalink
Date
2010
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
20420.pdf
1.91 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zavyalova, Lena
;
Su, Irene
;
Jang, Stephen
;
Cobb, Jonathan
;
Ward, Brian
;
Sorensen, Jacob
;
Song, Hua
;
Gao, Weimin
;
Lucas, Kevin
;
Lorusso, Gian
;
Hendrickx, Eric
Journal
Abstract
Description
Metrics
Views
1935
since deposited on 2021-10-19
Acq. date: 2025-12-10
Citations
Metrics
Views
1935
since deposited on 2021-10-19
Acq. date: 2025-12-10
Citations