Publication:
In-depth characterization of the hole mobility in 50-nm process-induced strained MOSFETs
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1904 since deposited on 2021-10-16
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Acq. date: 2026-08-07
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Statistics
Views
1904 since deposited on 2021-10-16
2last month
2last week
Acq. date: 2026-08-07
Citations