Publication:
Modelling and microstructural characterisation of incubation, time-dependent drift and saturation during electromigration in Al-Si-Cu stripes
Date
| dc.contributor.author | Witvrouw, Ann | |
| dc.contributor.author | Bender, Hugo | |
| dc.contributor.author | Roussel, Philippe | |
| dc.contributor.author | Maex, Karen | |
| dc.contributor.imecauthor | Bender, Hugo | |
| dc.contributor.imecauthor | Roussel, Philippe | |
| dc.contributor.imecauthor | Maex, Karen | |
| dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
| dc.date.accessioned | 2021-10-14T11:58:01Z | |
| dc.date.available | 2021-10-14T11:58:01Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4030 | |
| dc.source.beginpage | 1603 | |
| dc.source.endpage | 1616 | |
| dc.source.issue | 11 | |
| dc.source.journal | Microelectronics and Reliability | |
| dc.source.volume | 39 | |
| dc.title | Modelling and microstructural characterisation of incubation, time-dependent drift and saturation during electromigration in Al-Si-Cu stripes | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |