Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Interface characterization of nanoscale laminate structures on dense dielectric substrates by x-ray reflectivity
Publication:
Interface characterization of nanoscale laminate structures on dense dielectric substrates by x-ray reflectivity
Date
2005-04
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Travaly, Youssef
;
Schuhmacher, Jorg
;
Martin Hoyas, Ana
;
Van Hove, Marleen
;
Maex, Karen
;
Abell, Thomas
;
Sutcliffe, Victor
;
Jonas, A.M.
Journal
Virtual Journal of Nanoscale Science and Technology
Abstract
Description
Metrics
Views
1967
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1967
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations