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Interface characterization of nanoscale laminate structures on dense dielectric substrates by x-ray reflectivity
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Interface characterization of nanoscale laminate structures on dense dielectric substrates by x-ray reflectivity
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Date
2005
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Travaly, Youssef
;
Schuhmacher, Jorg
;
Martin Hoyas, Ana
;
Van Hove, Marleen
;
Maex, Karen
;
Abell, Thomas
;
Sutcliffe, Victor
;
Jonas, A.M.
Journal
Virtual Journal of Nanoscale Science and Technology
Abstract
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1974
since deposited on 2021-10-16
Acq. date: 2026-07-26
Citations
Statistics
Views
1974
since deposited on 2021-10-16
Acq. date: 2026-07-26
Citations