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Study of wafer warpage for Fan-Out wafer level packaging: finite element modelling and experimental validation
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Study of wafer warpage for Fan-Out wafer level packaging: finite element modelling and experimental validation
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Salahouelhadj, Abdellah
;
Gonzalez, Mario
;
Vanstreels, Kris
;
Podpod, Arnita
;
Phommahaxay, Alain
;
Rebibis, Kenneth June
;
Beyne, Eric
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1991
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-16
Citations
Metrics
Views
1991
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-16
Citations