Publication:

Advanced carrier depth profiling on Si and Ge with M4PP

Date

2007

Proceedings Paper

Simple item page Full metadata Statistics

Author(s)

Clarysse, Trudo

;

;

Parmentier, Brigitte

;

Van Daele, Benny

;

Satta, Alessandra

;

Vandervorst, Wilfried

;

;

Petersen, Dirch

;

Folmer Nielsen, Peter

Statistics

1944 since deposited on 2021-10-16

Acq. date: 2026-06-21