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Structural characterization of N-face GaN epilayers grown on Ge (111) by plasma assisted molecular beam epitaxy
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Structural characterization of N-face GaN epilayers grown on Ge (111) by plasma assisted molecular beam epitaxy
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Date
2013
Journal article
https://doi.org/10.1039/C3CE41836G
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Liyang
;
Lieten, Ruben
;
Zhu, Tongtong
;
Leys, Maarten
;
Jiang, Sijia
;
Borghs, Gustaaf
Journal
CrystEngComm
Abstract
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1921
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Views
1921
since deposited on 2021-10-21
2
last month
1
last week
Acq. date: 2026-01-08
Citations