Publication:
TOF-SIMS as a rapid diagnostic tool to monitor the growth mode of thin (high k) films
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2054 since deposited on 2021-10-15
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Acq. date: 2026-01-19
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Statistics
Views
2054 since deposited on 2021-10-15
2last month
2last week
Acq. date: 2026-01-19
Citations