Publication:
TOF-SIMS as a rapid diagnostic tool to monitor the growth mode of thin (high k) films
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2052 since deposited on 2021-10-15
1last month
Acq. date: 2026-01-07
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Metrics
Views
2052 since deposited on 2021-10-15
1last month
Acq. date: 2026-01-07
Citations