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The impact of the gate dielectric quality in developing Au-free D-mode and E-mode recessed gate AlGaN/GaN transistors on a 200mm Si substrate
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The impact of the gate dielectric quality in developing Au-free D-mode and E-mode recessed gate AlGaN/GaN transistors on a 200mm Si substrate
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Date
2015
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Tian-Li
;
Marcon, Denis
;
De Jaeger, Brice
;
Van Hove, Marleen
;
Bakeroot, Benoit
;
Lin, Dennis
;
Stoffels, Steve
;
Kang, Xuanwu
;
Roelofs, Robin
;
Groeseneken, Guido
;
Decoutere, Stefaan
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1897
since deposited on 2021-10-23
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Acq. date: 2025-12-15
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Metrics
Views
1897
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-15
Citations