Publication:

Part II: Investigation of subthreshold swing in line tunnel FETs using bias stress measurements

Date

2013

Journal article

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Author(s)

;

Vandooren, Anne

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;

;

Rooyackers, Rita

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;

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Rao, V Ramgopal

;

Groeseneken, Guido

;

Collaert, Nadine

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Journal

IEEE Transactions on Electron Devices

Metrics

1875 since deposited on 2021-10-21

Acq. date: 2025-12-16