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Effective and Efficient Testing of Large Numbers of Inter-Die Interconnects in Chiplet-Based Multi-Die Packages
Publication:
Effective and Efficient Testing of Large Numbers of Inter-Die Interconnects in Chiplet-Based Multi-Die Packages
Date
2023
Proceedings Paper
https://doi.org/10.1109/VTS56346.2023.10140006
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5.62 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chuang, Po-Yao
;
Lorenzelli, Francesco
;
Chakravarty, Sreejit
;
Wu, Cheng-Wen
;
Gielen, Georges
;
Marinissen, Erik Jan
Journal
2023 IEEE 41st VLSI Test Symposium (VTS)
Abstract
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1
since deposited on 2023-07-24
Acq. date: 2025-10-26
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1134
since deposited on 2023-07-24
Acq. date: 2025-10-26
Citations
Metrics
Downloads
1
since deposited on 2023-07-24
Acq. date: 2025-10-26
Views
1134
since deposited on 2023-07-24
Acq. date: 2025-10-26
Citations