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Quantification of elements at the Si/SiO2-interface
Publication:
Quantification of elements at the Si/SiO2-interface
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Date
2000
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Janssens, Tom
;
Vandervorst, Wilfried
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Abstract
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1856
since deposited on 2021-10-14
Acq. date: 2026-01-06
Citations
Metrics
Views
1856
since deposited on 2021-10-14
Acq. date: 2026-01-06
Citations