Publication:

Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors

Date

2021

Journal article

https://doi.org/10.1109/TNS.2021.3066612

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Author(s)

Gorchichko, Mariia

;

;

;

Bonaldo, Stefano

;

Schrimpf, Ronald D.

;

Reed, Robert A.

;

Linten, Dimitri

;

;

Fleetwood, Daniel M.

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

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1872 since deposited on 2021-11-02

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Acq. date: 2026-04-25