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Electrical characterization of functional oxides for resistive random access memory (RRAM) application
Publication:
Electrical characterization of functional oxides for resistive random access memory (RRAM) application
Date
2013-06
Dissertation
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35804.pdf
17.53 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Yangyin
Journal
Abstract
Description
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1941
since deposited on 2021-10-21
432
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1941
since deposited on 2021-10-21
432
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations