Publication:
Electrical characterization of functional oxides for resistive random access memory (RRAM) application
Date
| dc.contributor.author | Chen, Yangyin | |
| dc.contributor.imecauthor | Chen, Yangyin | |
| dc.contributor.thesisadvisor | Groeseneken, Guido | |
| dc.contributor.thesisadvisor | Wouters, Dirk | |
| dc.date.accessioned | 2021-10-21T06:56:51Z | |
| dc.date.available | 2021-10-21T06:56:51Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2013-06 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22133 | |
| dc.title | Electrical characterization of functional oxides for resistive random access memory (RRAM) application | |
| dc.type | PHD thesis | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |