Publication:

Evidence of a new degradation mechanism in high-k dielectrics at elevated temperatures

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1944 since deposited on 2021-10-18
2last month
Acq. date: 2025-12-11

Citations

Metrics

Views

1944 since deposited on 2021-10-18
2last month
Acq. date: 2025-12-11

Citations