Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Understanding the impact of CD-SEM artifacts on metrology via experiments and simulations
Publication:
Understanding the impact of CD-SEM artifacts on metrology via experiments and simulations
Date
2015
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fang, Chao
;
Vaglio Pret, Alessandro
;
Smith, Mark D.
;
Biafore, John J.
;
Robertson, Steward
;
Bekaert, Joost
Journal
Abstract
Description
Metrics
Views
1919
since deposited on 2021-10-22
418
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1919
since deposited on 2021-10-22
418
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations