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Understanding the impact of CD-SEM artifacts on metrology via experiments and simulations
Publication:
Understanding the impact of CD-SEM artifacts on metrology via experiments and simulations
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Date
2015
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fang, Chao
;
Vaglio Pret, Alessandro
;
Smith, Mark D.
;
Biafore, John J.
;
Robertson, Steward
;
Bekaert, Joost
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1921
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations
Metrics
Views
1921
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations