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Direct measurement of the inversion charge in MOSFETs: application to mobility extraction in alternative gate dielectrics
Publication:
Direct measurement of the inversion charge in MOSFETs: application to mobility extraction in alternative gate dielectrics
Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kerber, Andreas
;
Cartier, Eduard
;
Ragnarsson, Lars-Ake
;
Rosmeulen, Maarten
;
Pantisano, Luigi
;
Degraeve, Robin
;
Kim, Young-Chang
;
Groeseneken, Guido
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2005
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
2005
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations