GaN-on-Si process defect detection and analysis for HB-LEDs and power devices

Halder, Sandip; Stiers, Karen; Kandaswamy, Prem Kumar; Rosmeulen, Maarten; Carbonell, Laure; Saripalli, Yoga; Osman, Haris; Rosseel, Erik; Mani, Antonio; Hu, Qiona; Vedula, Srinivas; Polli, Marco

Publication:

GaN-on-Si process defect detection and analysis for HB-LEDs and power devices

Date

2013

Proceedings Paper

Simple item page Full metadata Statistics

Files

26638.pdf 773.94 KB

Author(s)

Halder, Sandip

;

Stiers, Karen

;

Kandaswamy, Prem Kumar

;

;

;

;

;

;

;

;

;

Statistics

3 since deposited on 2021-10-21

Acq. date: 2026-02-25

1999 since deposited on 2021-10-21

Acq. date: 2026-02-25

GaN-on-Si process defect detection and analysis for HB-LEDs and power devices

Date

Files

Author(s)

Journal

Abstract

Description

Statistics

Downloads

Views

Citations

Statistics

Downloads

Views

Citations