Publication:
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs
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2099 since deposited on 2022-02-14
44last month
37last week
Acq. date: 2026-07-16
Views
1691 since deposited on 2022-02-14
1last month
Acq. date: 2026-07-16
Citations