Publication:
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs
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1516 since deposited on 2022-02-14
178last month
33last week
Acq. date: 2026-01-26
Views
1683 since deposited on 2022-02-14
1last month
Acq. date: 2026-01-26
Citations