Publication:
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs
Date
Loading...
Journal
Abstract
Description
Statistics
Downloads
1669 since deposited on 2022-02-14
147last month
23last week
Acq. date: 2026-02-27
Views
1689 since deposited on 2022-02-14
6last month
Acq. date: 2026-02-27
Citations
Statistics
Downloads
1669 since deposited on 2022-02-14
147last month
23last week
Acq. date: 2026-02-27
Views
1689 since deposited on 2022-02-14
6last month
Acq. date: 2026-02-27
Citations