Publication:

Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

Date

2022-03-27
Proceedings Paper
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dc.contributor.authorVandemaele, Michiel
dc.contributor.authorKaczer, Ben
dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorBury, Erik
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorFranco, Jacopo
dc.contributor.authorMakarov, Alexander
dc.contributor.authorMertens, Hans
dc.contributor.authorHellings, Geert
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorMertens, Hans
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2022-02-14T12:21:28Z
dc.date.available2022-02-14T12:21:28Z
dc.date.issued2022-03-27
dc.identifier.issn/
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38859
dc.source.conferenceInternational Reliability Physics Symposium (IRPS)
dc.source.conferencedate27-31 March 2022
dc.source.conferencelocationDallas, Texas, USA + virtual
dc.source.journal/
dc.source.numberofpages9
dc.subject.disciplineElectrical & electronic engineering
dc.subject.keywordsBorder traps, forksheet FETs, gate-all-around FETs, hot-carrier degradation, interface defects, nanosheet FETs, nanowire FETs, oxide defects, simulations, TCAD, trapping
dc.title

Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

dc.typeProceedings paper
dspace.entity.typePublication
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