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Measurement and simulation of boron diffusivity in strained Si1-XGex epitaxial layers
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Measurement and simulation of boron diffusivity in strained Si1-XGex epitaxial layers
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Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Krishnasamy, Rajendran
;
Schoenmaker, Wim
Journal
VLSI Design
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1932
since deposited on 2021-10-14
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Acq. date: 2025-12-15
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Metrics
Views
1932
since deposited on 2021-10-14
1
last month
1
last week
Acq. date: 2025-12-15
Citations