Publication:

Interface admittance measurement and simulation of dual gated CVD WS2 MOSCAPs: Mapping the D-IT(E) profile

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1415 since deposited on 2021-11-02
395item.page.metrics.field.last-week
Acq. date: 2025-10-25

Citations

Metrics

Views

1415 since deposited on 2021-11-02
395item.page.metrics.field.last-week
Acq. date: 2025-10-25

Citations