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Interface admittance measurement and simulation of dual gated CVD WS2 MOSCAPs: Mapping the D-IT(E) profile
Publication:
Interface admittance measurement and simulation of dual gated CVD WS2 MOSCAPs: Mapping the D-IT(E) profile
Date
2021
Journal article
https://doi.org/10.1016/j.sse.2021.108035
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Koladi Mootheri, Vivek
;
Wu, Xiangyu
;
Cott, Daire
;
Groven, Benjamin
;
Heyns, Marc
;
Asselberghs, Inge
;
Radu, Iuliana
;
Lin, Dennis
Journal
SOLID-STATE ELECTRONICS
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1415
since deposited on 2021-11-02
395
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1415
since deposited on 2021-11-02
395
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations