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Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime
Publication:
Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime
Date
2000
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Henson, Kirklen
;
Yang, N.
;
Kubicek, Stefan
;
Vogel, E. M.
;
Wortman, J.
;
De Meyer, Kristin
;
Naem, Abdalla
Journal
IEEE Trans. Electron Devices
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1910
since deposited on 2021-10-14
Acq. date: 2025-10-22
Citations
Metrics
Views
1910
since deposited on 2021-10-14
Acq. date: 2025-10-22
Citations