Publication:

Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime

Date

2000
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorHenson, Kirklen
dc.contributor.authorYang, N.
dc.contributor.authorKubicek, Stefan
dc.contributor.authorVogel, E. M.
dc.contributor.authorWortman, J.
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorNaem, Abdalla
dc.contributor.imecauthorKubicek, Stefan
dc.contributor.imecauthorDe Meyer, Kristin
dc.date.accessioned2021-10-14T13:03:36Z
dc.date.available2021-10-14T13:03:36Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4425
dc.source.beginpage1393
dc.source.endpage1400
dc.source.issue7
dc.source.journalIEEE Trans. Electron Devices
dc.source.volume47
dc.title

Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
4417.pdf
Size:
172.71 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles