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Articles
NH3 PDA Temperature-Impact on Low-Frequency Noise Behavior of Si0.7Ge0.3 pFinFETs
Publication:
NH3 PDA Temperature-Impact on Low-Frequency Noise Behavior of Si0.7Ge0.3 pFinFETs
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Date
2022
Journal article
https://doi.org/10.1109/TED.2022.3212324
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xie, Duan
;
Simoen, Eddy
;
Arimura, Hiroaki
;
Capogreco, Elena
;
Mitard, Jerome
;
Horiguchi, Naoto
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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1309
since deposited on 2023-01-29
Acq. date: 2025-12-15
Citations
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Views
1309
since deposited on 2023-01-29
Acq. date: 2025-12-15
Citations