Publication:

Defect and Fault Modeling Framework for STT-MRAM Testing

Date

2021
Journal article
https://doi.org/10.1109/TETC.2019.2960375
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Author(s)

Wu, Lizhou
;
Rao, Siddharth  
;
Taouil, Mottaqiallah
;
Medeiros, Guilherme Cardoso
;
Fieback, Moritz
;
Marinissen, Erik Jan  
;
Kar, Gouri Sankar  
;
Hamdioui, Said

Journal

IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING

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