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Defect and Fault Modeling Framework for STT-MRAM Testing
Publication:
Defect and Fault Modeling Framework for STT-MRAM Testing
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Date
2021
Journal article
https://doi.org/10.1109/TETC.2019.2960375
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Lizhou
;
Rao, Siddharth
;
Taouil, Mottaqiallah
;
Medeiros, Guilherme Cardoso
;
Fieback, Moritz
;
Marinissen, Erik Jan
;
Kar, Gouri Sankar
;
Hamdioui, Said
Journal
IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING
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Acq. date: 2025-12-12
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Views
1917
since deposited on 2022-03-03
1
last month
Acq. date: 2025-12-12
Citations