Theory and experiments of the impact of work function variability on threshold voltage variability in MOS devices

Publication:

2012

Journal article

Author(s)

Zhang, Xiao

;

;

;

Hoffmann, Thomas Y.

;

Deal, Michael

;

Grubbs, M.E.

;

Li, Jing

;

Magyari-Kope, B.

;

Clemens, Bruce

;

Nishi, Yoshio

IEEE Transactions on Electron Devices

1898 since deposited on 2021-10-20

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Acq. date: 2026-04-28