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Theory and experiments of the impact of work function variability on threshold voltage variability in MOS devices
Publication:
Theory and experiments of the impact of work function variability on threshold voltage variability in MOS devices
Date
2012
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Xiao
;
Mitard, Jerome
;
Ragnarsson, Lars-Ake
;
Hoffmann, Thomas Y.
;
Deal, Michael
;
Grubbs, M.E.
;
Li, Jing
;
Magyari-Kope, B.
;
Clemens, Bruce
;
Nishi, Yoshio
Journal
IEEE Transactions on Electron Devices
Abstract
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1895
since deposited on 2021-10-20
Acq. date: 2025-10-25
Citations
Metrics
Views
1895
since deposited on 2021-10-20
Acq. date: 2025-10-25
Citations