Publication:
Analytical model for anomalous positive bias temperature instability in La-based HfO2 nFETs based on independent characterization of charging components
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1882 since deposited on 2021-10-21
Acq. date: 2025-10-23
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Views
1882 since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations