Publication:
Analytical model for anomalous positive bias temperature instability in La-based HfO2 nFETs based on independent characterization of charging components
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1883 since deposited on 2021-10-21
Acq. date: 2025-12-09
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Views
1883 since deposited on 2021-10-21
Acq. date: 2025-12-09
Citations