Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Dopant profiling in NixSi1-x gates with SIMS
Publication:
Dopant profiling in NixSi1-x gates with SIMS
Date
2005
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Janssens, Tom
;
Kmieciak, Malgorzata
;
Kittl, Jorge
;
Fouchier, Marc
;
Lauwers, Anne
;
Kottantharayil, Anil
;
Vandervorst, Wilfried
Journal
Abstract
Description
Metrics
Views
1948
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1948
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations