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Fabrication and use of metal tip and tip-on-tip probes for AFM-based device analysis
Publication:
Fabrication and use of metal tip and tip-on-tip probes for AFM-based device analysis
Date
1998
Proceedings Paper
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2826.pdf
1.47 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hantschel, Thomas
;
De Wolf, Peter
;
Trenkler, Thomas
;
Stephenson, Robert
;
Vandervorst, Wilfried
Journal
Abstract
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1977
since deposited on 2021-09-30
Acq. date: 2025-10-24
Citations
Metrics
Views
1977
since deposited on 2021-09-30
Acq. date: 2025-10-24
Citations