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On the impact of interface energy and vacancy concentration on morphology changes and nucleation of oxide precipitates in silicon
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On the impact of interface energy and vacancy concentration on morphology changes and nucleation of oxide precipitates in silicon
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Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhellemont, Jan
Journal
Applied Physics Letters
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1826
since deposited on 2021-09-29
Acq. date: 2025-12-17
Citations
Metrics
Views
1826
since deposited on 2021-09-29
Acq. date: 2025-12-17
Citations