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Scalability of plasma enhanced atomic layer deposited ruthenium films for interconnect applications
Publication:
Scalability of plasma enhanced atomic layer deposited ruthenium films for interconnect applications
Date
2012
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Swerts, Johan
;
Armini, Silvia
;
Carbonell, Laure
;
Delabie, Annelies
;
Franquet, Alexis
;
Mertens, Sofie
;
Popovici, Mihaela Ioana
;
Schaekers, Marc
;
Witters, Thomas
;
Tokei, Zsolt
;
Beyer, Gerald
;
Van Elshocht, Sven
;
Gravey, Virginie
;
Cockburn, Andrew
;
Shah, Kavita
;
Aubuchon, Joseph
Journal
Journal of Vacuum Science and Technology A
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1914
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1914
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations